CISC Semiconductor will sponsor 2019 IEEE International Conference on RFID Technology and Applications from 25th -27th of September, 2019 at Pisa Italy. TheIEEE RFID-TA 2019 provides a forum for the advancement of RFID technology and practice; it aims at strengthening relations between industry, research institutions and academia and gives attendees a unique opportunity to share, [...]
Please visit our exhibit on RFID testing during the RAIN RFID event in Florence, Italy from 11th to 12th June. We will exhibit tests around reader phase sensitivity, EN 302 208 tag tests and ISO/IEC 18046-2 reader tests with RFID Xplorer. In addition CISC will offer valuable insights on the latest in the RAIN industry. [...]
CISC was awarded with two top industry awards at the annual AIM industry honors held at RFID Journal Live in Phoenix, Az last week. First the Ted William award, which was awarded to Josef Preishuber-Pflügl, Executive Vice - President CTO, Business Manager RFID+NFC, in recognition for his exception contribution to further the RFID industry through [...]
European EPC Competence Center (EECC) has partnered with CISC on its latest annual report, titled "UHF RFID Transponder Benchmark (UTPS)” that helps retailers to determine which RFID tags they should be using, and highlights the costs and specific pain points each platform tackles. RFID Xplorer was used in the testing process as the “benchmark” test [...]
Debangana Mukherjee, Director Business Development+ Sales, is selected as the new vice-chair for AIM North America. Her selection in the leadership team further strengthens CISC's commitment towards development and promotion of the AIDC technology with particular focus on RAIN in the North American market. Attached is the full press release
Please visit our exhibit on RFID testing during the RAIN RFID event in Memphis, TN from 5th to 7th March. We will exhibit tests around reader phase sensitivity, EN 302 208 tag tests and ISO/IEC 18046-2 reader tests with RFID Xplorer. For personalized demo please feel free to contact us.
CISC will be exhibiting at RFID Journal Live, in Phoenix, AZ, USA. Please, feel free to stop by our booth #845 from April 2nd to 4th 2019 to see CISC RFID Xplorer is action. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all RAIN RFID tests: Tag performance testsTag conformance testsReader performance testsReader conformance tests with sniffer [...]
Debangana Mukherjee will speak at the Integrating AIDC in the Connected World Workshop on 26th Sept, at Label Expo 2018.
Join Debangana Mukherjee and other industry experts at the Connected World Workshop on 26th Sept, at Label Expo 2018 in Chicago. Let us discuss about how RAIN RFID and other AIDC technologies will solve your deployment and asset tracking challenges. For registration please click here.
CISC will exhibit its latest full comprehensive UHF RFID test equipment for ISO/IEC 18000-63, EPC Gen2V2, RAIN RFID and also Chinese standards like GB/T 29768 at the RFID & Wireless IoT tomorrow in Darmstadt, Germany. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all UHF RFID tests: Tag performance tests Tag conformance tests Reader [...]