Debangana Mukherjee, Director Business Development+ Sales, is selected as the new vice-chair for AIM North America. Her selection in the leadership team further strengthens CISC's commitment towards development and promotion of the AIDC technology with particular focus on RAIN in the North American market. Attached is the full press release
Please visit our exhibit on RFID testing during the RAIN RFID event in Memphis, TN from 5th to 7th March. We will exhibit tests around reader phase sensitivity, EN 302 208 tag tests and ISO/IEC 18046-2 reader tests with RFID Xplorer. For personalized demo please feel free to contact us.
CISC will be exhibiting at RFID Journal Live, in Phoenix, AZ, USA. Please, feel free to stop by our booth #845 from April 2nd to 4th 2019 to see CISC RFID Xplorer is action. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all RAIN RFID tests: Tag performance testsTag conformance testsReader performance testsReader conformance tests with sniffer [...]
Debangana Mukherjee will speak at the Integrating AIDC in the Connected World Workshop on 26th Sept, at Label Expo 2018.
Join Debangana Mukherjee and other industry experts at the Connected World Workshop on 26th Sept, at Label Expo 2018 in Chicago. Let us discuss about how RAIN RFID and other AIDC technologies will solve your deployment and asset tracking challenges. For registration please click here.
CISC will exhibit its latest full comprehensive UHF RFID test equipment for ISO/IEC 18000-63, EPC Gen2V2, RAIN RFID and also Chinese standards like GB/T 29768 at the RFID & Wireless IoT tomorrow in Darmstadt, Germany. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all UHF RFID tests: Tag performance tests Tag conformance tests Reader [...]
CISC will exhibit its latest full comprehensive UHF RFID test equipment for ISO/IEC 18000-63, EPC Gen2V2, RAIN RFID and also Chinese standards like GB/T 29768 at the Internet of Things Exhibition in Shenzhen, China. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all UHF RFID tests: Tag performance tests Tag conformance tests Reader performance tests [...]
CISC Semiconductor (CISC) is pleased to announce the appointment of Debangana Mukherjee to the Board of Directors of the Association for Automatic Identification & Mobility (AIM) North America (NA) chapter, an alliance enabling the cooperation, development, standardization of AIDC technologies. “CISC is committed towards enabling the growth and standardization of testing and verification of the RAIN RFID [...]
You are Invited! Webinar: Understanding the sensitivity of RAIN RFID Readers. Every RAIN RFID Reader needs to be accurate, efficient and must have a good sensitivity in order for it to detect the tag signal in background noise. But the sensitivity of the readers are more often limited by different factors. Want to learn more [...]
Present market 2017 was a great year for the RAIN RFID technology. The technology that started out as a solution to improve inventory management in logistics is now used in different vertical industries. Some of its applications include tracking vital drugs in hospitals, timing races, tracking bags in airline industry, workflow management in industrial manufacturing [...]
CISC Semiconductor will be exhibiting at RFID Journal Live! 2018 in Orlando, FL, USA. Please, feel free to stop by our booth #1450 from April 10th to 12th 2018. We are looking forward to meeting you! Please contact us for personalized demo of CISC RFID Xplorer.