CISC Semiconductor will be exhibiting at RFID Journal Live! 2017 in Phoenix, Arizona. Please feel free to stop by our booth #749 from May 9th to 11th 2017. We are looking forward to meeting you! Please contact us for personalized demo of CISC RFID Xplorer.
Leveraging the UHF RFID test and measurement expertise CISC advanced the CISC RFID Xplorer with latest SDR (software defined radio) technology and software to a new level of UHF RFID / RAIN RFID / EPC Gen2 / ISO/IEC 18000-63 measurement capabilities. CISC has launched a single device putting all you need for RFID tests and [...]
On November 15th 2016 CISC was invited among 86 other companies at the ODEON Theatre in Vienna to receive the certificate „Family Friendly Enterprise“ issued by federal Ministry of Families and Youth of the Republic of Austria. Markus Pistauer, CEO of CISC Semiconductor GmbH, in talk with Sophie Karmasin, Federal Minister of Families and Youth [...]
The Department of Electrical and Computer Engineering of National Chiao-Tung University, a Taiwan based university, has recently developed an RFID-based on-lens sensor system for noninvasive long-term intraocular pressure monitoring. The sensor IC, fabricated in a 0.18 µm CMOS process, consists of capacitive sensor readout circuitry, RFID communication circuits, and digital processing units. The sensor IC [...]
CISC RFID Xplorer reader tester is new tool which is featured on the Ident magazine. It is a tool to evaluate the performance and conformance of RFID reader, record the communication of the tag and reader in real time and analyze this communication for the purpose of debugging of application setups and the development of [...]
Ralph Weissnegger from CISC Semiconductor is giving a talk at Design, Automation and Test Conference 2016 (DATE) in Dresden (March 17th, 2016) about the new feature in new CISC tool SHARC to enhance and speed-up reliability-testing for automotive safety-critical systems.
CISC issued a white paper on NFC Interoperability testing. This papers highlights the incredible growth and ubiquitous use of smartphones in all aspects of our daily lives. In particular various initiatives are under way to use smartphones in ‘card emulation’ mode to replace plastic contactless credit cards. In order to ensure great customer experience with mobile [...]
CISC CTO will speak on NFC Fachtagung 2016 in Seibersdorf, Austria on Interoperability as Key to Successful NFC Deployment.
CISC Semiconductor and MET Labs have joined forces to work together to provide GS1 EPC Gen2v2 Compliance. CISC already provides Gen2v2 test support on its UHF RFID test equipment now and will have available the ratified version in June 2015. For the PRESS RELEASE please click here.