27 07, 2017

CISC is exhibiting at RFID & Wireless IoT tomorrow in Düsseldorf, Germany on Sept. 27+28, 2017

July 27th, 2017|All, Events, News|0 Comments

CISC will exhibit its latest full comprehensive RAIN RFID test equipment for ISO/IEC 18000-63, EPC Gen2V2 & RAIN RFID reader sensitivity guideline tests at RFID &Wireless IoT tomorrow 2017 in Düsseldorf, Germany from September 27-28. The CISC RFID Xplorer is ONE device in ONE suitcase and covers all UHF RFID tests: Tag performance tests Tag conformance tests [...]

19 06, 2017

CISC RFID Xplorer – New product features

June 19th, 2017|All, News|0 Comments

CISC RFID Xplorer has been extended with new product features for Tag Tester and Reader Tester. Details are available in the brochures that are available for download: CISC RFID Xplorer - Tag Tester - New Features  CISC RFID Xplorer - Reader Tester - New Features

27 02, 2017

G&D VISA Mobile Payment Application – A reliable reference

February 27th, 2017|Blog, News, Tech Talk|0 Comments

CISC Semiconductor is working on NFC Interoperability testing and is providing both test equipment and test services since 2012. In the last five years of testing all levels of NFC performance with the different mobile phones, NFC chipsets, smart cards and NFC terminals have been seen. G&D UICCs have always played an important role in [...]

7 02, 2017

CISC is exhibiting RFID Journal Live! – See us at booth #749

February 7th, 2017|All, Events, News|0 Comments

CISC Semiconductor will be exhibiting at  RFID Journal Live! 2017 in Phoenix, Arizona. Please feel free to stop by our booth #749 from May 9th to 11th 2017. We are looking forward to meeting you! Please contact us  for personalized demo of CISC RFID Xplorer.

24 01, 2017

CISC RFID Xplorer – ONE DEVICE in your hand for ALL RFID measurements

January 24th, 2017|News|2 Comments

Leveraging the UHF RFID test and measurement expertise CISC advanced the CISC RFID Xplorer with latest SDR (software defined radio) technology and software to a new level of UHF RFID / RAIN RFID / EPC Gen2 / ISO/IEC 18000-63 measurement capabilities. CISC has launched a single device putting all you need for RFID tests and [...]

28 11, 2016

We are familyfriendly!

November 28th, 2016|All, News|0 Comments

On November 15th 2016 CISC was invited among 86 other companies at the ODEON Theatre in Vienna to receive the certificate „Family Friendly Enterprise“ issued by federal Ministry of Families and Youth of the Republic of Austria. Markus Pistauer, CEO of CISC Semiconductor GmbH, in talk with Sophie Karmasin, Federal Minister of Families and Youth [...]

20 10, 2016

CISC RFID Xplorer supports the now published RAIN RFID reader sensitivity testing recommendation.

October 20th, 2016|All, News|0 Comments

RAIN RFID Alliance has recently published a RAIN RFID sensitivity testing recommendation for testing and reporting the sensitivity of RAIN RFID UHF readers. The document addresses the fact that the latest generation of RAIN RFID UHF tags need such low power that reader receivers become the limiting factor in respect to the communication range. The [...]

30 09, 2016

NCTU research on RFID-based On-lens Sensor System relies on CISC RFID measurement solutions.

September 30th, 2016|Blog, Media, News|0 Comments

The Department of Electrical and Computer Engineering of National Chiao-Tung University, a Taiwan based university, has recently developed an RFID-based on-lens sensor system for noninvasive long-term intraocular pressure monitoring. The sensor IC, fabricated in a 0.18 µm CMOS process, consists of capacitive sensor readout circuitry, RFID communication circuits, and digital processing units. The sensor IC [...]

15 08, 2016

CISC RFID Xplorer reader tester features on Ident magazine.

August 15th, 2016|Blog, News|0 Comments

CISC RFID Xplorer reader tester is new tool which is featured on the Ident magazine. It is a tool to evaluate the performance and conformance of RFID reader, record the communication of the tag and reader in real time and analyze this communication for the purpose of debugging of application setups and the development of [...]

14 03, 2016

Case Study: IP-XACT Extensions for Safety-Critical Embedded Systems

March 14th, 2016|Events, News|0 Comments

Ralph Weissnegger from CISC Semiconductor is giving a talk at Design, Automation and Test Conference 2016 (DATE) in Dresden (March 17th, 2016) about the new feature in new CISC tool SHARC to enhance and speed-up reliability-testing for automotive safety-critical systems.

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