11 03, 2016

NFC Interoperability white paper

March 11th, 2016|News|0 Comments

CISC issued a white paper on NFC Interoperability testing. This papers highlights the incredible growth and ubiquitous use of smartphones in all aspects of our daily lives. In particular various initiatives are under way to use smartphones in ‘card emulation’ mode to replace plastic contactless credit cards. In order to ensure great customer experience with mobile [...]

11 03, 2016

CISC will exhibit and speech on NFC Fachtagung 2016 in Seibersdorf, Austria

March 11th, 2016|News|0 Comments

CISC CTO will speak on NFC Fachtagung 2016  in Seibersdorf, Austria on Interoperability as Key to Successful NFC Deployment.

19 02, 2016

CISC Semiconductor and MET Labs Work Together to Provide GS1 EPC Gen2v2 Compliance Tests.

February 19th, 2016|News|0 Comments

CISC Semiconductor and MET Labs have joined forces to work together to provide GS1 EPC Gen2v2 Compliance. CISC already provides Gen2v2 test support on its UHF RFID test equipment now and will have available the ratified version in June 2015. For the PRESS RELEASE please click here.

29 01, 2016

CISC has joined NFC Forum

January 29th, 2016|News|0 Comments

In 2016 CISC has joined NFC-Forum in order to even better collaborate with our customers and actively participate in the NFC ecosystem. Having more than 10 years successful experience in HF and UHF RFID testing equipment, CISC has been developing its NFC competence and business in the last 5 years. Our NFC test solutions and [...]

19 01, 2016

CISC is exhibiting RFID Journal Live! – See us at booth #845

January 19th, 2016|Events, News|0 Comments

CISC Semiconductor will be exhibiting at  RFID Journal Live! 2016 in Orlando. Please feel free to stop by our booth #845 from May 3rd to 5th 2016. We are looking forward to meeting you! Please contact us if you would like to make an appointment.

10 12, 2015

CISC Semiconductor releases improved “UHF RFID Real Time Sniffer” for reader and application testing

December 10th, 2015|News|0 Comments

CISC Semiconductor is happy to announce the release of new and improved UHF RFID real-time “Sniffer” for CISC RFID Xplorer; a versatile equipment to resolve all tag and reader performance, RFID deployment and chip development issues. Sniffer is a tool to analyze RFID reader and tag signals and communication. The detection and decoding of reader [...]

25 02, 2015

CISC RFID Xplorer ready to perform tagged-item testing

February 25th, 2015|News|0 Comments

CISC RFID Xplorer is ready to perform measurement tests based on “tagged-item test procedure” defined by the GS1 Tagged Item Performance Protocol (TIPP) Guideline. This test is used as criteria for establishing that a tagged-item meets a specified grade level. For the complete information please read the PRESS RELEASE.

22 10, 2014

CISC Semiconductor extends it sales network in key locations globally

October 22nd, 2014|News|0 Comments

CISC Semiconductor strengthens its global presence by adding new partners in global key locations. Klagenfurt, Austria – 16 September. CISC Semiconductor (CISC) is pleased to announce that 3 new partners have joined CISC to provide CISC RFID/NFC test and measurement solutions and to maximize the existing customer satisfaction. This will ensure prompt local support on [...]

28 07, 2014

CISC now a member of the RAIN Alliance

July 28th, 2014|News|0 Comments

CISC Semiconductor is pleased to announce that we are now a member of the RAIN Alliance. RAIN is an industry alliance that will promote awareness, education, and initiatives to accelerate UHF RFID growth and adoption in business and consumer applications worldwide.

25 07, 2014

Subject-Matter Experts Needed to Accelerate Certification Efforts

July 25th, 2014|News|0 Comments

Josef Preishuber-Pflügl is the chief technology officer of CISC Semiconductor and the head of the International RFID Institute's Certification Committee, is seeking SMEs to help us increase their database of certification questions, and to create new certification exams. To read the full article please click here.

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